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Radiation Effects and Electronics Reliability

Ron Schrimpf, Orrin H. Ingram Professor of Engineering, Director of the Institute for Space and Defense Electronics
Semiconductor device physics, radiation effects and reliability in semiconductor devices, microelectronic test structures, and simulation tools for microelectronics

Dan Fleetwood, Olin H. Landreth Professor of Engineering, Chair of Electrical Engineering and Computer Science
Effects of ionizing radiation on microelectronic devices and materials, microelectronics reliability, defects and low-frequency noise.

Michael Alles, Research Professor of Electrical Engineering

Ken Galloway, Distinguished Professor of Engineering
Solid state devices, microelectronics, reliability, radiation effects