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‘Radiation Effects and Reliability (RER)’

Microelectronics master Dan Fleetwood named AAAS Fellow

Nov. 26, 2019—Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the first scientists to identify the...

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ISDE leads $3 million international study of radiation on 3D electronics

Dec. 5, 2017—The Vanderbilt Institute for Space and Defense Electronics (ISDE) will lead an international team of researchers investigating how radiation affects 3D electronics and systems under a three-year $3 million federal project. The team includes world-leading research and development groups in 3D integrated circuit technologies in both industry and academia. The basic research grant, from the...

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As electronics advance, so do radiation effects and reliability research

Dec. 2, 2011—, professor of electrical engineering and computer engineering, knows radiation from as far away as deep space and as close as our sun poses significant dangers to both space-based and earthbound computers that control missile-guidance systems, supercomputers and telecommunications systems, and even cell phones and iPods. The cost of service interruptions to such systems can...

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