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‘single-event upsets (SEUs)’

Large university, industry team analyzes single electron that can zap technology

Jan. 15, 2014—Paper first-authored by engineering graduate student wins IEEE Outstanding Conference Paper Award As phones and other electronics shrink in size, they’ve grown in capabilities and ubiquitousness. But, as semiconductors – the omnipresent and indispensable building blocks of the electronics and computer industries – get to the 28 to 45 nanometer feature size (the diameter of...

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