Soft Error Mitigation in Advanced Microelectronic Circuits
Lloyd W. Massengill, Prof EECS, PI
Bharat Bhuva, EECS
Tim Holman, EECS
Brief Description of Project:
Student will actively participate within the Radiation Effects in Circuits Research Group in the investigation of soft error causes and mitigation in advanced-technology microelectronic technologies at or below the 14nm fabrication node. Students will either perform circuit simulation using EDA tools or participate in experimental testing and data analysis. There is the potential for publishable results.
Computer literacy, especially desire to learn and/or use circuit simulation software codes.
Junior or better standing.
EE coursework completed through electronic circuits
Nature of Supervision:
The student will work closely with a senior graduate student within the research group and/or a profession ISDE engineer. The student will report results at our weekly group meeting to the PI and associated faculty.
A Brief Research Plan (period is for 10 weeks):
Weeks 1-2: orientation and training
Weeks 3-8: circuit simulation and/or testing, data analysis, weekly progress reports
Weeks 9-10: wrap up, poster presentation preparation, out-brief of findings to the research group
Number of Open Slots: 1
Name: Lloyd Massengill
Department: EECS / ISDE
Campus Address: 1025 16th Ave. South, Suite 200 (ISDE Building)
Mailing Address: Vanderbilt Institute for Space and Defense Electronics (ISDE) 1025 16th Ave. South, Suite 200
Nashville, TN 37212
Phone: (615) 343-6677