SenSys
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Vanderbilt researchers’ work passes computing society’s test of time
Ten years ago Vanderbilt researchers published a paper that has passed the test of time. This year, the Conference on Embedded Networked Sensor Systems (SenSys) introduced a new Test of Time Award at its 12th annual event held in Nov. 3-6 in Memphis, Tenn. SenSys is… Read MoreNov. 13, 2014