Yitian Long
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Vanderbilt students win esteemed best paper awards at SPIE international medical imaging forum
Four Vanderbilt engineering students working in the fields of computer science and electrical and computer engineering won prestigious best paper awards at the 2025 SPIE Medical Imaging conference held Feb. 16-20 in San Diego. Vanderbilt attendees. SPIE is the international society for optics and photonics and the week-long conference… Read MoreMar. 5, 2025