Olin H. Landreth Professor of Engineering
Professor of Electrical Engineering
Professor of Physics
Effects of ionizing radiation on microelectronic devices & materials. Origin(s) of 1/f noise in semiconductors, semiconductor devices, and metals. Thermally stimulated current methods to profile defects in insulators. Radiation hardness assurance test methods. Charge trapping in silicon dioxide, and interface-trap generation. Radiation effects modeling and simulation. Novel microelectronic materials, including silicon-on-insulator materials. Electronics for high-radiation and high-temperature environments. Advanced microelectronic processing/characterization, including ultrathin oxides & alternative dielectrics.
Memberships & Activities
Fellow, The American Physical Society
Chairman, IEEE NPSS Radiation Effects Committee
Former Chair (2005), APS Forum on Industrial and Applied Physics
Sigma Pi Sigma, Phi Beta Kappa
International Correspondence Chess GrandMaster
Awards & Honors
IEEE Nuclear and Plasma Sciences Society’s Merit Award, 2009
Purdue University, Distinguished Science Alumnus, 2007.
Discover Magazine (1998), R&D Magazine R&D 100 (1997) and Industry Week Technology of Year (1997) Awards, for co-invention of protonic nonvolatile field effect transistor memory (patent issued 11/3/1998).
More than 20 Outstanding/Meritorious Conference Paper Awards for IEEE Conferences on Nuclear and Space Radiation Effects and Conferences on Hardened Electronics and Radiation Technology.
Distinguished Member of the Technical Staff, Sandia National Laboratories, 1990-1999.
Daniel M. Fleetwood received his B. S., M. S., and Ph. D. degrees in Physics from Purdue University in 1980, 1981, and 1984. Dan joined Sandia National Laboratories in Albuquerque, New Mexico, in 1984, and was named a Distinguished Member of the Technical Staff in the Radiation Technology and Assurance Department in 1990. In 1999 he accepted a position as Professor of Electrical Engineering at Vanderbilt University in Nashville, Tennessee. In 2000, he was also named a Professor of Physics, in 2001 he was appointed Associate Dean for Research of the Vanderbilt School of Engineering, and in 2003 he was named Chair of the Electrical Engineering and Computer Science Department. Dan is the author of more than 500 publications on radiation effects in microelectronics, 11 of which have been recognized with Outstanding Paper Awards. These papers have been cited more than 18,000 times (citation h factor = 76, Google Scholar). In 2009, he received the IEEE Nuclear and Plasma Sciences Society’s Merit Award, which is the society’s highest individual technical honor. He currently serves as Senior Editor, Radiation Effects, for the IEEE Transactions on Nuclear Science, and Distinguished Lecturers Chair for the IEEE Nuclear and Plasma Sciences Society. Dan is a Fellow of both the Institute for Electrical and Electronics Engineers and The American Physical Society, and a member of ASEE, Phi Beta Kappa, and Sigma Pi Sigma.