Electrical Engineering And Computer Science
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Schrimpf honored with Best Oral Presentation award at RADECS conference
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreSep. 29, 2010
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Vanderbilt engineers, neurosurgeon develop database, software that improves Parkinson’s surgery
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreSep. 14, 2010
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Robinson to receive inaugural Young Alumni Award from Florida A&M University
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreSep. 13, 2010
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VU plays key role in $20M federal grant designed to strengthen Tennessee’s R&D infrastructure
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreSep. 10, 2010
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Galloway joins global deans council
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreSep. 10, 2010
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Chancellor: 60 endowed faculty chairs to be added over two years
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreAug. 27, 2010
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VUSE rises in U.S. News & World Report’s 2011 rankings
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreAug. 17, 2010
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Sponsored research: Grants awarded to engineering faculty
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreJul. 28, 2010
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Vanderbilt engineer to participate in NAE’s U.S. Frontiers of Engineering symposium
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreJun. 25, 2010
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Sztipanovits elected External Member of Hungarian Academy of Sciences
Ron Schrimpf Professor of Electrical Engineering Ronald Schrimpf co-authored and received the Best Oral Presentation Award at the 2009 Radiation and its Effects on Components and Systems (RADECS) conference which was held in Bruges, Belgium. The paper entitled “Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors,” was… Read MoreJun. 18, 2010