Vanderbilt Associate Professor of Biomedical Engineering, Brett Byram, joins a group of 77 international scholars who were named Senior Members of SPIE, the international society for optics and photonics, in August.
Byram’s research specializes in improving the imaging quality of ultrasound technology, which is a relatively low-cost, highly versatile diagnostic tool. He runs the Biomedical Elasticity and Acoustic Measurement (BEAM) lab and is affiliated with the Vanderbilt Institute for Surgery and Engineering (VISE).
SPIE Senior Members are recognized for their professional experience and technical accomplishments, their active involvement with the optics community and with SPIE, and for significant performance that sets them apart from their peers.