Radiation Effects And Reliability (RER)

  • Vanderbilt University

    Microelectronics master Dan Fleetwood named AAAS Fellow

    Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the… Read More

    Nov. 26, 2019

  • Vanderbilt University

    ISDE leads $3 million international study of radiation on 3D electronics

    ISDE is the lead institution on a $3 million international study of radiation effects on 3D electronics. The Vanderbilt Institute for Space and Defense Electronics (ISDE) will lead an international team of researchers investigating how radiation affects 3D electronics and systems under a three-year $3 million federal project. The team… Read More

    Dec. 5, 2017

  • Vanderbilt University

    As electronics advance, so do radiation effects and reliability research

    Lloyd Massengill , professor of electrical engineering and computer engineering, knows radiation from as far away as deep space and as close as our sun poses significant dangers to both space-based and earthbound computers that control missile-guidance systems, supercomputers and telecommunications systems, and even cell phones and iPods. The cost… Read More

    Dec. 2, 2011