Radiation Effects And Reliability (RER)
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Microelectronics master Dan Fleetwood named AAAS Fellow
Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the… Read MoreNov. 26, 2019
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ISDE leads $3 million international study of radiation on 3D electronics
Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the… Read MoreDec. 5, 2017
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As electronics advance, so do radiation effects and reliability research
Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the… Read MoreDec. 2, 2011