Radiation Effects And Reliability (RER)
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Microelectronics master Dan Fleetwood named AAAS Fellow
Daniel M. Fleetwood, Olin H. Landreth Professor of Engineering, has been named a fellow of the American Association for the Advancement of Science for distinguished contributions to the field of microelectronics reliability, particularly for enhancing the understanding of defects, radiation response and low-frequency noise. He is considered one of the… Read MoreNov. 26, 2019
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ISDE leads $3 million international study of radiation on 3D electronics
ISDE is the lead institution on a $3 million international study of radiation effects on 3D electronics. The Vanderbilt Institute for Space and Defense Electronics (ISDE) will lead an international team of researchers investigating how radiation affects 3D electronics and systems under a three-year $3 million federal project. The team… Read MoreDec. 5, 2017
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As electronics advance, so do radiation effects and reliability research
Lloyd Massengill , professor of electrical engineering and computer engineering, knows radiation from as far away as deep space and as close as our sun poses significant dangers to both space-based and earthbound computers that control missile-guidance systems, supercomputers and telecommunications systems, and even cell phones and iPods. The cost… Read MoreDec. 2, 2011