Radiation Effects in Electronics Program

This module introduces mechanisms and terminology associated with various types of radiation effects in electronic devices, and provides an introduction to the overall video series.

This module will present an overview of single-event data that one might collect for a range of component types. Basic terminology, units, and computational methods used to prepare single event data for reliability estimations will be presented.

Discusses CREME96, how to gain access and navigate the site. The tool flow is presented and environment modules are discussed. Particle spectra for various orbits are generated.

Part II of Introduction to CREME96 discusses the transport of a space environment through material shielding, computation of the LET spectra, and prediction of proton and heavy ion single event effect rates. Guidance and examples are provided to identify the impact of limitations and uncertainties in the calculations.

This module addresses radiation-induced failures in semiconductor power devices, focusing on single event effects in space and terrestrial environments. It covers challenges like single event burnout (SEB) and single event gate rupture (SEGR) in devices such as transistors, diodes, MOSFETs, and IGBTs, along with proposed mitigation strategies.

This module introduces radiation-enabled modeling and simulation for pre-fabrication verification of electronics intended for space. It focuses on applying these models at the circuit and board levels to address transient radiation effects and parametric degradation, providing participants with an introductory understanding of various modeling approaches.

This module will explore single-event response of different FPGA technologies. Techniques for evaluating single-event vulnerability of designs will be discussed along with techniques for mitigating single-event effects.

This module covers the fundamental aspects of the natural space ionizing radiation environment and its impact on electronics reliability and modeling. It introduces key terminology, the physics of charged particle transport, and the origins of high-energy ions in various spacecraft orbits, relating these concepts to tools like CREME-MC and SPENVIS.

This module discusses some of the theoretical and practical aspects of performing single-event testing at a heavy ion facility. Topics covered in the video include a review of counting statistics, cross section vs. LET plots, ionselection, device preparation and test planning. The video will also give some suggestions for test planning and preparation, time estimation, and troubleshooting common problems at the facility.

Introduction to Spacecraft Charging discusses the basic mechanisms of surface and internal charging, the role of the environment, and how chargingresults in anomalies and physical degradation. Design guidance is referenced to reduce threats associated with charging.